Due to increasingly complex and automated manufacturing processes, the demands on the control parameters of these processes are also increasing. In many applications, such a parameter is the fill quantity, whose precise determination is of ever growing importance. This paper shows with which accuracy and precision an M-sequence ultra-wideband radar can determine levels in small metallic and non-metallic containers with contact-based and contactless measurements. First, the principle of level measurement using guided wave radar is explained and the measurement setup is described. Afterward, the measurement results are shown and discussed. The measurements show that the level can be measured with an accuracy of better than 0.5 mm. In addition, level fluctuations can be detected with a precision of 3 ${\rm \mu }$m. Based on the results of the guided wave radar, the possibilities of volumetric contactless measurement using an electrically small patch antenna are discussed. A particular challenge in contactless level measurement is the high number of multipath components, which strongly influence the accuracy. In addition, there are near-field effects when measuring close to the antenna. Exploiting these near-field effects, an additional method to accurately determine the full state of the container is investigated.