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1 - The Need for ASAT

from Introductory Section

Published online by Cambridge University Press:  03 March 2022

Thomas F. Kelly ,
Brian P. Gorman  and
Simon P. Ringer
Thomas F. Kelly
Affiliation:
Steam Instruments, Inc.
Brian P. Gorman
Affiliation:
Colorado School of Mines
Simon P. Ringer
Affiliation:
University of Sydney
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Summary

The historical backdrop for the role of microscopy in the development of human knowledge is reviewed. Atomic-scale investigations are a logical step in a natural progression of increasingly more powerful microscopies. A brief outline of the concept of atomic-scale analytical tomography (ASAT) is given, and its implications for science and technology are anticipated. The intersection of ASAT with advanced computational materials engineering is explored. The chapter concludes with a look toward a future where ASAT will become common.

Keywords

Robert Hookefield ion microscopeelectron microscopehistory of microscopyAntonie van Leeuwenhoek
Type
Chapter
Information
Atomic-Scale Analytical Tomography
Concepts and Implications
 , pp. 3 - 10
Publisher: Cambridge University Press
Print publication year: 2022

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References

Hooke, R., Micrographia. London: Jo. Martyn, and Ja. Allestry, 1665.Google Scholar
Pesché, J., “Wheel, Fire, Microscope,” presented at the Nanoventures 2003, Dallas, Texas, Mar. 2003.Google Scholar
Kelly, T. F., Miller, M. K., Rajan, K., and Ringer, S. P., “Atomic-Scale Tomography: A 2020 Vision,” Microsc. Microanal., vol. 19, no. 3, pp. 652–664, 2013.Google Scholar
Kelly, T. F., “Atomic-Scale Analytical Tomography,” Microsc. Microanal., vol. 23, no. 1, pp. 34–45, 2017, doi: https://doi.org/10.1017/S1431927617000125.CrossRefGoogle ScholarPubMed
Tiecke, T. G., Thompson, J. D., de Leon, N. P. et al., “Nanophotonic Quantum Phase Switch with a Single Atom,” Nature, vol. 508, no. 7495, pp. 241–244, Apr. 2014, doi: https://doi.org/10.1038/nature13188.Google Scholar
Avouris, P., “Carbon Nanotube Electronics and Photonics,” Phys. Today, vol. 62, no. 1, pp. 34–40, Jan. 2009, doi: https://doi.org/10.1063/1.3074261.Google Scholar
Leuthold, J. et al., “Single Atom Electronics and Photonics (Conference Presentation),” in Silicon Photonics: From Fundamental Research to Manufacturing, May 2018, vol. 10686, p. 1068605. doi: https://doi.org/10.1117/12.2311894.Google Scholar
Raviprasad, K., Hutchinson, C. R., Sakurai, T., and Ringer, S. P., “Precipitation Processes in an Al-2.5Cu-1.5 Mg (wt. %) Alloy Microalloyed with Ag and Si,” Acta Mater., vol. 51, no. 17, pp. 5037–5050, Oct. 2003, doi: https://doi.org/10.1016/S1359-6454(03)00351-3.Google Scholar
Hono, K., “Atom Probe Microanalysis and Nanoscale Microstructures in Metallic Materials,” Acta Mater., vol. 47, no. 11, pp. 3127–3145, Sep. 1999, doi: https://doi.org/10.1016/S1359-6454(99)00175-5.Google Scholar
Chen, Z., Ren, J., Yuan, Z., and Ringer, S. P., Mater. Sci. Eng. A, vol. 787, p. 139447, 2020.Google Scholar
Stephenson, L. T., Moody, M. P., Gault, B., and Ringer, S. P., “Estimating the Physical Cluster-Size Distribution within Materials Using Atom-Probe,” Microsc. Res. Tech., vol. 74, no. 9, pp. 799–803, Sep. 2011, doi: https://doi.org/10.1002/jemt.20958.Google Scholar
Stephenson, L. T., Moody, M. P., Liddicoat, P. V., and Ringer, S. P., “New Techniques for the Analysis of Fine-Scaled Clustering Phenomena within Atom Probe Tomography (APT) Data,” Microsc. Microanal., vol. 13, no. 6, pp. 448–463, 2007.Google Scholar
De Geuser, F. and Gault, B., “Metrology of Small Particles and Solute Clusters by Atom Probe Tomography,” Acta Mater., vol. 188, pp. 406–415, Apr. 2020, doi: https://doi.org/10.1016/j.actamat.2020.02.023.Google Scholar
Voyles, P. M. and Muller, D. A., “Fluctuation Microscopy in the STEM,” Ultramicroscopy, vol. 93, no. 2, pp. 147–159, Nov. 2002, doi: https://doi.org/10.1016/S0304-3991(02)00155-9.Google Scholar
Billinge, S. J. L., “Nanostructure Studied Using the Atomic Pair Distribution Function,” Z. Krist. Suppl, vol. 26, pp. 17–26, 2007.Google Scholar
Zhu, C. et al., “Towards Three-Dimensional Structural Determination of Amorphous Materials at Atomic Resolution,” Phys. Rev. B, vol. 88, no. 10, p. 100201, Sep. 2013, doi: https://doi.org/10.1103/PhysRevB.88.100201.Google Scholar
Jensen, K. M. Ø. et al., “Demonstration of Thin Film Pair Distribution Function Analysis (tfPDF) for the Study of Local Structure in Amorphous and Crystalline Thin Films,” IUCrJ, vol. 2, no. 5, pp. 481–489, Jul. 2015, doi: https://doi.org/10.1107/S2052252515012221.CrossRefGoogle Scholar
Haley, D., Petersen, T., Barton, G., and Ringer, S. P., “Influence of Field Evaporation on Radial Distribution Functions in Atom Probe Tomography,” Philos. Mag., vol. 89, no. 11, pp. 925–943, 2009, doi: https://doi.org/10.1080/14786430902821610.CrossRefGoogle Scholar
Billinge, S. J. L. and Levin, I., “The Problem with Determining Atomic Structure at the Nanoscale,” Science, vol. 316, no. 5824, pp. 561–565, 2007.Google Scholar
Falcone, R. et al., “Developing a vision for the infrastructure and facility needs of the materials community: Report of NSF Materials 2022 (A Subcommittee of the Mathematical and Physical Sciences Advisory Committee),” US National Science Foundation, 2012. [Online]. Available: www.nsf.gov/attachments/124926/public/DMR_Materials_2022_Report.pdfGoogle Scholar
Müller, E. W., “Field Ion Microscopy,” Science, vol. 149, no. 3684, pp. 591–601, 1965.Google Scholar
Panitz, J. A., “Field-Ion Microscopy – A Review of Basic Principles and Selected Applications,” J. Phys. E, vol. 15, no. 12, pp. 1281–1294, 1982.Google Scholar

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