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6 - The Origin of Noise

from Part II - Noise and Electronic Interfaces

Published online by Cambridge University Press:  23 December 2021

Marco Tartagni
Marco Tartagni
Affiliation:
University of Bologna
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Summary

Understanding the origin of noise is important because it gives hints on how to reduce its effects even from the electronic point of view. This chapter analyzes the physics background of some sources of random processes that are limiting sensing systems referred to as “thermal,” “shot,” and “flicker” noises. It also shows how thermal and shot noises are at the base of other observed electronic effects such as “kTC,” “phase,” and “current” noises. The discussion uses analogies between mechanical and electronic effects of thermal agitation. This is important not only for understanding the process but also to unify the model of noise in microelectromechanical sensor systems so as to use the same analysis framework.

Keywords

thermal noiseJohnson noiseshot noisecurrent noiseflicker noise1/f noisekTC noiseresonatorphase noiseLorentzian
Type
Chapter
Information
Electronic Sensor Design Principles , pp. 251 - 312
Publisher: Cambridge University Press
Print publication year: 2022

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References

Further Reading

Baghdady, E. J., Lincoln, R. N., and Nelin, B. D., Short-term frequency stability: Characterization, theory, and measurement. Proc. IEEE, vol. 53, pp. 704–722, 1965.Google Scholar
Brillouin, L., Science and Information Theory, 2nd ed. Mineola, NY: Dover Publications, 1962.CrossRefGoogle Scholar
Cutler, L. S. and Searle, C. L., Some aspects of the theory and measurement of frequency fluctuations in frequency standards. Proc. IEEE, vol. 54, pp. 136–154, 1966.CrossRefGoogle Scholar
Drakhlis, B., Calculate oscillator jitter by using phase-noise analysis, Microwaves RF, vol. 40, no. 2, pp. 109–119, 2001.Google Scholar
Feynman, R. P., Robert, B. L., Sands, M., and Gottlieb, M. A., The Feynman Lectures on Physics. Reading, MA: Pearson/Addison-Wesley, 1963.Google Scholar
Gabrielson, T. B., Mechanical-thermal noise in micromachined acoustic and vibration sensors. IEEE Trans. Electron Devices, vol. 40, pp. 903–909, 1993.Google Scholar
Hajimiri, A., and Lee, T. H., A general theory of phase noise in electrical oscillators. IEEE J. Solid-State Circuits, vol. 33, pp. 179–194, 1998.CrossRefGoogle Scholar
Hajimiri, A., and Lee, T. H., The Design of Low Noise Oscillators. Norwell, MA: Kluwer Academic, 2003.Google Scholar
Hajimiri, A., Limotyrakis, S., and Lee, T. H., Jitter and phase noise in ring oscillators. IEEE J. Solid-State Circuits, vol. 34, pp. 790–804, 1999.CrossRefGoogle Scholar
Ham, D., and Hajimiri, A.,Virtual damping and Einstein relation in oscillators, IEEE J. Solid-State Circuits, vol. 38, no. 3, pp. 407–418, Mar. 2003.Google Scholar
Herzel, F., and Razavi, B., A study of oscillator jitter due to supply and substrate noise. IEEE Trans. Circuits Syst. II: Analog Digital Signal Process., vol. 46, pp. 56–62, 1999.Google Scholar
Johnson, J. B., Thermal agitation of electricity in conductors. Nature, 119, p. 50, 1927.CrossRefGoogle Scholar
Johnson, J. B., Thermal agitation of electricity in conductors. Phys. Rev., 541, pp. 97–129, 1927.Google Scholar
Keshner, M. S., 1/F Noise. Proc. IEEE, vol. 70, pp. 212–218, 1982.CrossRefGoogle Scholar
Lee, T. H., and Hajimiri, A., Oscillator phase noise: A tutorial. IEEE J. Solid-State Circuits, vol. 35, 2000.CrossRefGoogle Scholar
Leeson, D. B., A simple model of feedback oscillator noise spectrum. Proc. IEEE, vol. 54, pp. 329–330, 1966.CrossRefGoogle Scholar
MacDonald, D. K. C., Noise and Fluctuations. New York: John Wiley & Sons, 1962.Google Scholar
McNeill, J. A., Jitter in ring oscillators, 1994.Google Scholar
Nyquist, H., Thermal agitation of electric charge in conductors. Phys.Rev., 32, pp. 110–113, 1928.Google Scholar
Phillips, J., and Kundert, K., An introduction to cyclostationary noise. Cust. Integr. Circuits Conf. pp. 1–43, 2000.Google Scholar
Razavi, B., A study of phase noise in CMOS oscillators. IEEE J. Solid-State Circuits, vol. 31, pp. 331–343, 1996.Google Scholar
Rice, S. O., Mathematical analysis of random noise. Bell System Tech. J. 23, pp. 282–332, 1944.CrossRefGoogle Scholar
Sarpeshkar, R., Delbruck, T., and Mead, C. A., White noise in MOS transistors and resistors. IEEE Circuits Devices Mag., vol. 9, pp. 23–29, 1993.Google Scholar

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  • The Origin of Noise
  • Marco Tartagni, University of Bologna
  • Book: Electronic Sensor Design Principles
  • Online publication: 23 December 2021
  • Chapter DOI: https://doi.org/10.1017/9781139629225.007
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To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Dropbox.

  • The Origin of Noise
  • Marco Tartagni, University of Bologna
  • Book: Electronic Sensor Design Principles
  • Online publication: 23 December 2021
  • Chapter DOI: https://doi.org/10.1017/9781139629225.007
Available formats
×

Save book to Google Drive

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Google Drive.

  • The Origin of Noise
  • Marco Tartagni, University of Bologna
  • Book: Electronic Sensor Design Principles
  • Online publication: 23 December 2021
  • Chapter DOI: https://doi.org/10.1017/9781139629225.007
Available formats
×