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2 - Large-signal vector measurement techniques with NVNAs

Published online by Cambridge University Press:  05 July 2011

Patrick Roblin
Patrick Roblin
Affiliation:
Ohio State University
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Summary

In this chapter we shall first review the various measurement techniques which are traditionally used for the characterization of RF circuits. Next we will introduce several nonlinear vector network analyzers (NVNAs) that have been developed to characterize the nonlinear response of circuits at radio frequencies (RF). Having described the operating principle of the various NVNAs, we will then focus in the rest of this chapter on the sampler-based NVNA. In particular, its operating principle, calibration, and extension to broadband modulation and pulsed RF signals will be discussed in detail. Overall, this chapter will provide some insights into nonlinear measurement techniques, which should complement the remaining chapters concerned with platform-independent modeling, design, and linearization techniques.

Measurement of RF signals

Various kinds of equipment are used to acquire and analyze RF signals: power meters, spectrum analyzers, oscilloscopes, vector signal analyzers. Power meters are used to accurately measure the RF power. Usually they are used to characterize steady-state RF signals but some power meters have a wide input bandwidth and can provide a measurement of the instantaneous signal power for modulated RF signals within a prescribed bandwidth. The accuracy of power meters is usually traceable to world standards and such equipment can therefore be used for power calibration.

Spectrum analyzers permit the measurement of the power spectral density of RF signals versus frequency. Typically the data are acquired during a finite-duration time window and Fourier transformed to the frequency domain for a wide frequency range.

Type
Chapter
Information
Nonlinear RF Circuits and Nonlinear Vector Network Analyzers
Interactive Measurement and Design Techniques
 , pp. 17 - 65
Publisher: Cambridge University Press
Print publication year: 2011

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References

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