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7 - Nonlinear characterization and modeling of dispersive effects in high-frequency power transistors

Published online by Cambridge University Press:  25 October 2011

By
Olivier Jardel ,
Raphael Sommet ,
Jean-Pierre Teyssier  and
Raymond Quéré
Edited by
Matthias Rudolph ,
Christian Fager  and
David E. Root
Olivier Jardel
Affiliation:
University of Limoges, France; Now with 3–5 Lab
Raphael Sommet
Affiliation:
University of Limoges, France
Jean-Pierre Teyssier
Affiliation:
University of Limoges, France
Raymond Quéré
Affiliation:
University of Limoges, France
Matthias Rudolph
Affiliation:
Brandenburg University of Technology
Christian Fager
Affiliation:
Chalmers University of Technology, Gothenberg
David E. Root
Affiliation:
Agilent Technologies, Santa Rosa
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Summary

Introduction

Power amplifiers (PAs) are key elements of telecommunications and radar front ends at radio frequencies. Recent evolutions are driving the use of those power amplifiers in more and more complex conditions. These result from an increased complexity of signals that are fed into the PA on the one hand, and from the increased density of power that solid state PAs are required to support on the other hand. In both cases – modulated signals used in telecommunications systems and complex pulsed signals used in radar systems – there exist low-frequency components which excite the dispersive phenomena that are present in electronic devices. From the point of view of systems designers, the dispersion phenomena appear as memory effects in PAs. Those memory effects can be classified as short-term memory (STM) effects and long-term memory (LTM) effects [1]. A typical simplified schematic of a radio frequency (RF) PA is given in Figure 7.1, where the bias networks, the matching networks (Qe and Qs) as well as the embedding thermal network (Zth (ω) are shown. Typically, STM effects result from input and output matching networks as well as microwave electrical time constants involved in the device itself. They lie in the picosecond (ps) or nanosecond (ns) range. On the other hand, LTM effects are due to biasing networks, self-heating and trapping effects as well as networks which are dedicated to the overall management of the PA.

Type
Chapter
Information
Nonlinear Transistor Model Parameter Extraction Techniques , pp. 206 - 256
Publisher: Cambridge University Press
Print publication year: 2011

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References

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