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A Novel Scanning X-Ray Diffracto-Microscope/X-Ray Powder Diffractometer using Converged X-Ray Beam

Published online by Cambridge University Press:  06 March 2019

Ken Yukino ,
Pujio P. Okamura ,
Hiroshi Biozaki ,
Yuji Kobayashi  and
Yoshiyuki Yamada
Ken Yukino
Affiliation:
National Institute for Research in inorganic Materials, Tsukuba, Ibaraki 305, Japan
Pujio P. Okamura
Affiliation:
National Institute for Research in inorganic Materials, Tsukuba, Ibaraki 305, Japan
Hiroshi Biozaki
Affiliation:
National Institute for Research in inorganic Materials, Tsukuba, Ibaraki 305, Japan
Yuji Kobayashi
Affiliation:
Rigaku Corporation, Akishima, Tokyo 196, Japan
Yoshiyuki Yamada
Affiliation:
Rigaku Corporation, Akishima, Tokyo 196, Japan
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Abstract

A new type of scanning X-ray diffracto-microscope (SXDM) / X-ray powder diffractometer (XPD) which uses a converged incident beam, was designed, manufactured, and some of its basic characteristics were examined. The optical system consists of asymmetric reflection type curved crystal monochromators for both incident and reflection beams, a detector (FSPC, X-ray film, IP, nuclear plate), a translation mechanism for the specimen and also for the detector.

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References

1) Yukino, K. and Uno, R.: Jpn. J. Appl. Phys. 25: 661 (1986).Google Scholar
2) Yukino, K.: FC Report 7: 401 (1989) [in Japanese].Google Scholar
3) Ono, A.: Jpn. J. Appl. Phys. 27: L2276 (1988).Google Scholar