Hostname: page-component-cd9895bd7-8ctnn Total loading time: 0 Render date: 2024-12-28T20:28:59.889Z Has data issue: false hasContentIssue false
  • English
  • Français

Fabrication and Selected Applications of a Nist X-Ray Microfluorescence Spectrometer

Published online by Cambridge University Press:  06 March 2019

P.A. Pella  and
L. Feng
P.A. Pella
Affiliation:
National Institute of Standards and Technology Gaithersburg, MD 20899
L. Feng
Affiliation:
National Institute of Standards and Technology Gaithersburg, MD 20899
Get access

Extract

An x-ray microfluorescence (XRMF) spectrometer has been designed and fabricated at NIST for multi-point compositional analysis of small samples with x-ray beam sizes on the order of 50 micrometers or greater. This system was developed as part of an industrial cooperative research agreement with Kevex Instruments, Inc., San Carlos, CA., and consists of commercially available components incorporated in an aluminum vacuum chamber (see Figs. 1 and 2).

Type
XIII. XRS Techniques and Instrumentation
Information
Advances in X-Ray Analysis , Volume 35 , Issue B: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 1063 - 1067
Copyright
Copyright © International Centre for Diffraction Data 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Hurley, R. G., Watkins, W. L. H., and Griffis, R. C., Ford Motor Co., SAE Technical Paper Series No, 890582, presented at International Congress and Exposition, Detroit, Michigan, 1989.Google Scholar