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L X-Ray Line Shape of Copper(II) Compounds and their Covalency

Published online by Cambridge University Press:  06 March 2019

Jun Kawai ,
Katsumi Nakajima ,
Kuniko Maeda  and
Yohichi Gohshi
Jun Kawai
Affiliation:
RIKEN (The Institute of Physical and Chemical Research) Wako, Saitama, 351-01, Japan
Katsumi Nakajima
Affiliation:
Department of Industrial Chemistry, . University of Tokyo Hongo, Bunkyo-ku, Tokyo 113, Japan
Kuniko Maeda
Affiliation:
RIKEN (The Institute of Physical and Chemical Research) Wako, Saitama, 351-01, Japan
Yohichi Gohshi
Affiliation:
Department of Industrial Chemistry, . University of Tokyo Hongo, Bunkyo-ku, Tokyo 113, Japan
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Abstract

Profile changes of copper Lα (L3-V) and Lβ (L2-V) X-ray fluorescence spectra are interpreted. It is shown that the intensity of the high energy shoulder of the Cu L X-ray spectra has a relation to the intensity of the so-called ‘shake-up’ satellite in 2p X-ray photoelectron spectra; the high energy shoulder of the divalent copper La is weak for covalent compounds and strong for ionic compounds. It is also shown that the Lβ/Lα intensity ratio changes with the change of copper concentration of the analyte as well as the change of chemical state of the analyte.

Type
XIV. XRS Applications
Information
Advances in X-Ray Analysis , Volume 35 , Issue B: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 1107 - 1114
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

1. Barnole, V., Mariot, J. -M., Hague, C. F., Michel, C., and Raveau, B., Phys. Rev., B41,4262 (1990).10.1103/PhysRevB.41.4262Google Scholar
2. Redinger, J., Yu, J., Freeman, A. J., and Weinberger, P., Phys. Lett., A124, 463 (1987).10.1016/0375-9601(87)90555-XGoogle Scholar
3. Kawai, J. and Maeda, K., Spectrochim. Acta, 46B, 1243 (1991).10.1016/0584-8547(91)80120-RGoogle Scholar
4. van der Laan, G., Westra, C., Haas, C., and Sawatzky, G. A., Phys. Rev., B23,4369 (1981).10.1103/PhysRevB.23.4369Google Scholar
5. Kawai, J., Adv. X-Ray Anal. 34, 91 (1991).Google Scholar
6. Liefeld, R., Soft X-Ray Band Spectra and the Electronic Structure of Metals and Materials, Ed. D. J. Fabian, p. 133, Academic, London (1968).Google Scholar
7. Kawai, J. and Gohshi, Y., Spectroehim. Acta, 41B, 265 (1986).10.1016/0584-8547(86)80167-7Google Scholar
8. Kawai, J. and Maeda, K., Physica C (Proc. M2S-HTSC III), (in press).Google Scholar
9. Nakajima, K., Kawai, J., and Gohshi, Y., ibid (in press).Google Scholar
10. Tanaka, S., Doctoral Thesis, Tohoku University (1991).Google Scholar
11 Tanaka, S., Okada, K., and Kotani, A., J. Phys. Soc. Jpn., 58, 813 (1989).10.1143/JPSJ.58.813Google Scholar
12. Tanaka, S., Okada, K., and Kotani, A., Physica C (Proc. M2S-HTSC III), (in press),Google Scholar
13. Hague, C. F., Mariot, J. -M., Barnole, V., and Michel, C., ibid (in press).Google Scholar
14. Holliday, J. E., Adv. X-Ray Anal, 14,243(1971).Google Scholar
15. Koster, A. S., Mol. Phys., 26, 625 (1973).10.1080/00268977300101951Google Scholar
16. Grioni, M., Goedkoop, J. B., Schoorl, R., de Groot, F. M. F., Fuggle, J. C., Schafers, F., Koch, E. E., G. Rossi, J. -M. Estava, and Karnatak, R. C., Phys. Rev., B39, 1541 (1989).10.1103/PhysRevB.39.1541Google Scholar