The expert system described in the first part of this paper has been applied to the identification of mixed-layer phyllosilicates (mica-smectite, mica-vermiculite, chlorite-smectite, chlorite-vermiculite, chlorite-swelling chlorite, chlorite-mica, chlorite-talc, kaolinite-smectite, talc-smectite), and to the determination of their structural parameters (Reichweite, R, and proportions of constituting layers, Wi). The expert system has been run utilizing the data extracted from (1) experimental XRD patterns for which structural parameters had been evaluated by comparison with calculated patterns, or (2) patterns calculated using pre-selected values of the structural parameters. In all cases examined, the expert system provided correct conclusions concerning the identification of a mixed-layer phyllosilicate and the value of the Reichweite, while the abundances of the component layers were evaluated with a margin of error usually <5%.