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Burn-in procedures for a generalized model

Published online by Cambridge University Press:  14 July 2016

Ji Hwan Cha*
Affiliation:
Seoul National University
*
Postal address: Department of Statistics, Seoul National University, San 56-1, Shinrim-Dong, Kwanak-Ku, Seoul, 151–742, Korea. Email address: jhcha@statcom.snu.ac.kr

Abstract

In this paper two burn-in procedures for a general failure model are considered. There are two types of failure in the general failure model. One is Type I failure (minor failure) which can be removed by a minimal repair or a complete repair and the other is Type II failure (catastrophic failure) which can be removed only by a complete repair. During a burn-in process, with burn-in Procedure I, the failed component is repaired completely regardless of the type of failure, whereas, with burn-in Procedure II, only minimal repair is done for the Type I failure and a complete repair is performed for the Type II failure. In field use, the component is replaced by a new burned-in component at the ‘field use age’ T or at the time of the first Type II failure, whichever occurs first. Under the model, the problems of determining optimal burn-in time and optimal replacement policy are considered. The two burn-in procedures are compared in cases when both the procedures are applicable.

Type
Research Papers
Copyright
Copyright © Applied Probability Trust 2001 

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