Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Analytical and Instrumentation Science Symposia

Advances in Phase Retrieval Microscopy

Full-Field Stroboscopic Imaging of Acoustic and Thermal Dynamics in Isolated Nanostructures Using Tabletop EUV Coherent Imaging

Live Measurement of Electrical Charge Density in Materials using Off-Axis Electron Holography

High-speed and Large Field-of-view Imaging via X-ray Fly-scan Ptychography

Model-Based Iterative Reconstruction of Charge Density in Nanoscale Materials using Off-Axis Electron Holography

Precise Measurement of Carrier Concentrations in n-Type GaN by Phase-Shifting Electron Holography

Electron Hologram Denoising via Sparse Coding and Dictionary Learning

In-Plane Magnetic Field Evaluation with 0.47-nm Resolution by Aberration-Corrected 1.2-MV Holography Electron Microscope

Focused Electron-Beam Induced Deposition, In Situ TEM And Off-Axis Electron Holography Investigation of Bi-Magnetic Core-Shell Nanostructures

Towards Ptychography with Structured Illumination, and a Derivative-Based Reconstruction Algorithm

Iterative Algorithm of Atomic Potential Reconstruction Based on DPC Signal from Thick Specimens

Learning Phase Retrieval with Backpropagation

Contrast Transfer and Noise Minimization in Electron Ptychography

Electromagnetic Field Reconstructions of 4D-STEM Datasets using Ptychography and Differential Phase Contrast Imaging

Effectively Synchronizing 4D-STEM Detectors with Probe Movement

Assessing the Phase Accuracy of ePIE Reconstructions of Crystalline Materials

Electron Ptychography of Single Biological Macromolecules

Three-Dimensional Electrostatic Field at an Electron Nano-Emitter Determined by Differential Phase Contrast in Scanning Transmission Electron Microscopy

Structure Retrieval of Strongly Scattering Materials in the Transmission Electron Microscope

Spatial and Temporal Incoherence in Scanning Diffraction and Differential Phase Contrast

Nanoscale Quantification of Jahn-Teller Distortion in LaMnO3

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Analytical and Instrumentation Science Symposia

Advances in Phase Retrieval Microscopy