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Volume 16 - Supplement S2 - July 2010

Contents

Page 44 of 50

Physical Sciences Symposia

Probing the Properties of Nanomaterials with Microscopy

Abstract

  • In Situ TEM Study of Confined Dislocation Nucleation Processes

  • M Legros, F Mompiou, DS Gianola, A Stedlmayr, D Caillard
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1722-1723
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • In-Situ TEM Studies of Deformation Mechanisms in Nanograined Al Strengthened with Al2O3 Nanoparticles

  • BG Clark, JA Knapp, KM Hattar, HA Padilla, BL Boyce
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1724-1725
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Automated Orientation Imaging Microscopy of Nanoscale Al Thin Films After Rapid Solidification Using SEM and TEM

  • A Kulovits, G Facco, H Kotan, JMK Wiezorek
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1726-1727
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Automated Local Texture and Stress Analysis in Cu Interconnects Using D-STEM and Precession Microscopy

  • KJ Ganesh, S Rajasekhara, D Bultreys, J-P Zhou, PJ Ferreira
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1728-1729
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Localized Multi-Photon Photoelectron Emission From Indium Tin Oxide in Proximity to Gold in Nanostructured Gold-ITO-Glass Films

  • RC Word, T Dornan, R Könenkamp
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1730-1731
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Quantum Wells in Zn1-xCdxSe by High Resolution Electron Microscopy

  • HA Calderon, I Hernandez Calderon
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1734-1735
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • High Density of Si Nanodots in Silicon Oxide Nanowires by Electron Beam Irradiation

  • G-S Park, JH Lee, S Heo, H Kwon, J Park, SK Kim
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1736-1737
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Charge-Imbalance-Induced Resonance for Functional Nanowires

  • D Cohen-Tanugi, A Akey, N Yao
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1738-1739
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Dopant Impurity Induced Nanofaceting on Silicon Nanowire Sidewalls

  • F Li, PD Nellist, C Lang, DJH Cockayne
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1740-1741
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Transmission Electron Diffraction From Nanoparticles, Nanowires and Thin Films in an SEM With Conventional EBSD Equipment

  • RH Geiss, RR Keller, DT Read
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1742-1743
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • In Situ Probing of Electromechanical Properties of an Individual ZnO Nanobelt

  • A Asthana, K Momeni, R Shahbazian-Yassar, A Prasad, Y Yap
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1744-1745
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Quantitatively Probing the Mechanical Behavior of Submicron-sized Metal Pillars in the TEM

  • ZW Shan
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1746-1747
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Mitigating Focused Ion Beam Damage in Molybdenum Nanopillars by In Situ Annealing

  • MB Lowry, D Kiener, MM LeBlanc, C Chisholm, JN Florando, JW Morris, Jr, AM Minor
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1748-1749
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Investigation of Dielectric Breakdown on the Atomic Length-Scale Using In Situ STM-TEM

  • K van Benthem, CS Bonifacio, AM Thron, SM Weil, TB Holland
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1750-1751
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • In Situ Observation of Structure and Conductance Evolution of Gold Contact During Stretching

  • Y Oshima, Y Kurui, K Takayanagi
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1752-1753
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Evolution of FePt Nanoparticle Shape and L10 Order During In-Situ Annealing

  • JE Wittig, J Bentley, LF Allard, CM Lukehart
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1754-1755
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • In Situ TEM Experiments to Assess the Predictive Capability of Atomistic Models

  • HD Espinosa, B Peng, R Agrawal, RA Bernal
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1756-1757
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • In Situ Electron Microscopy Characterization of Optoelectronic Nanostructures and Nanodevices

  • M Gao, C Li, W Li, Z Liu, L-M Peng
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1758-1759
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 44 of 50