Powder Diffraction: Volume 24 - Issue 2

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 24 - Special Issue 2 - June 2009

Contents

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Denver X-Ray Conference

F-50 The New Bruker S8 Lion Multichannel XRF
A. Seyfarth, A. Buman, K. Behrens
Published online by Cambridge University Press:

20 May 2016, p. 164
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F-52 The New Orbis Micro-EDXRF Elemental Analyzer
J. Hardy, B. Scruggs
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20 May 2016, p. 164
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F-69 Micro-X-ray Fluorescence with the M4 Tornado
M. Haschke, W. Malzer, U. Rossek, U. Waldschläger, H. Wagenknecht
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20 May 2016, p. 164
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D-95 Invited—High-Throughput XRD and Analysis for Rapid Determination of Phase Distribution Across Combinatorial Libraries
I. Takeuchi
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20 May 2016, p. 164
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D-74 Invited—Structural Investigation of Combinatorial Ge-Co-Mn Epitaxial Thin-Film System Using Synchrotron X-ray Microprobe
Y. S. Chu, B. A. Collins, L. He, F. Tsui
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20 May 2016, p. 164
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D-9 Invited—Time-Resolved Structural Studies: Strategies for Rapidly Imaging and Analyzing Large Data Sets
M. J. Kramer
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20 May 2016, p. 164
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C-16 High Energy XRD/XRF for High-Throughput Analysis of Composition Spread Thin Films
J. M. Gregoire, R. B. van Dover
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20 May 2016, p. 164
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D-45 High-Energy X-ray Optics at the Advanced Photon Source
S. D. Shastri
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20 May 2016, p. 164
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C-14 Invited—High Energy X-ray Optics for Synchrotron Radiation
B. Lengeler
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20 May 2016, p. 165
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C-12 Invited—Optics for Nuclear Resonant Scattering at High Energies
T. S. Toellner
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20 May 2016, p. 165
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D-88 Invited—Sagittal Focusing of High-Energy X-rays by Sagittally Bent Laue Crystals: Design and Performance at NSLS X7B Beamline
Z. Zhong, D.M. Connor, A. Lenhard, H. Zhong, J. Hanson
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20 May 2016, p. 165
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D-101 High-Energy Micro-Focusing by Meridionally-Bent Laue Crystals
U. Lienert
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20 May 2016, p. 165
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C-1 Invited—Single-Grain Microstructure from Polycrystalline Specimens
T. Ungár
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20 May 2016, p. 165
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D-17 Invited—Analysis of Hierarchical Dislocation Arrangements at Different Length Scales
R. I. Barabash, G. E. Ice
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20 May 2016, p. 165
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D-14 Utilizing the Debye Equation in Nanomaterial Line Profile Analysis
K. Beyerlein, R.L. Snyder, P. Scardi
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20 May 2016, p. 165
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D-6 Invited—Different Aspects of Microstrain Broadening
A. Leineweber, E.J. Mittemeijer
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20 May 2016, p. 165
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D-52 Thermal Stability and Crystallization of Amorphous and Nanocrystalline TiO2 Thin Films and Powders Studied by XRD
R. Kužel, Z. Matĕj, L. Nichtová
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20 May 2016, p. 165
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D-71 High-Temperature X-ray Diffraction of ASTM A743 Grade CA6NM Cast Martensitic Stainless Steel
J. Rojas, A. Toro
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20 May 2016, p. 165
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D-91 Characterizing X-ray Mirrors in Reciprocal Space: Results from the NIST X-ray Optics Evaluation Double-Crystal Diffractometer
D. L. Gil, D. Windover, A. Henins, J. Cline
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20 May 2016, p. 165
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F-4 Invited—Simultaneous X-ray and Ion Beam Techniques for the Characterisation and Fingerprinting of Fine Particle Air Pollution and Its Sources in the Asian Region
D. D. Cohen
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20 May 2016, p. 165
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Page 3 of 8

First
« Prev
1
2
3
4
5
6
7
Next »
Last

Powder Diffraction

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Volume 24 - Special Issue 2 - June 2009

Denver X-Ray Conference

F-50 The New Bruker S8 Lion Multichannel XRF

F-52 The New Orbis Micro-EDXRF Elemental Analyzer

F-69 Micro-X-ray Fluorescence with the M4 Tornado

D-95 Invited—High-Throughput XRD and Analysis for Rapid Determination of Phase Distribution Across Combinatorial Libraries

D-74 Invited—Structural Investigation of Combinatorial Ge-Co-Mn Epitaxial Thin-Film System Using Synchrotron X-ray Microprobe

D-9 Invited—Time-Resolved Structural Studies: Strategies for Rapidly Imaging and Analyzing Large Data Sets

C-16 High Energy XRD/XRF for High-Throughput Analysis of Composition Spread Thin Films

D-45 High-Energy X-ray Optics at the Advanced Photon Source

C-14 Invited—High Energy X-ray Optics for Synchrotron Radiation

C-12 Invited—Optics for Nuclear Resonant Scattering at High Energies

D-88 Invited—Sagittal Focusing of High-Energy X-rays by Sagittally Bent Laue Crystals: Design and Performance at NSLS X7B Beamline

D-101 High-Energy Micro-Focusing by Meridionally-Bent Laue Crystals

C-1 Invited—Single-Grain Microstructure from Polycrystalline Specimens

D-17 Invited—Analysis of Hierarchical Dislocation Arrangements at Different Length Scales

D-14 Utilizing the Debye Equation in Nanomaterial Line Profile Analysis

D-6 Invited—Different Aspects of Microstrain Broadening

D-52 Thermal Stability and Crystallization of Amorphous and Nanocrystalline TiO2 Thin Films and Powders Studied by XRD

D-71 High-Temperature X-ray Diffraction of ASTM A743 Grade CA6NM Cast Martensitic Stainless Steel

D-91 Characterizing X-ray Mirrors in Reciprocal Space: Results from the NIST X-ray Optics Evaluation Double-Crystal Diffractometer

F-4 Invited—Simultaneous X-ray and Ion Beam Techniques for the Characterisation and Fingerprinting of Fine Particle Air Pollution and Its Sources in the Asian Region

Powder Diffraction

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Volume 24 - Special Issue 2 - June 2009

Denver X-Ray Conference