Denver X-Ray Conference
D-39 Monte-Carlo Simulations for Evaluation of Different Influences on Projections in Computed Tomography
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- 20 May 2016, p. 167
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F-59 X-ray Imaging on Biological Model Organisms Using Micro and Nano X-ray Fluorescence
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- 20 May 2016, p. 167
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F-17 Development of a 3D Elemental Reference Material for Confocal Micro X-ray Fluorescence
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- 20 May 2016, p. 167
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C-2 Invited—Single Grain Deformation Experiments at the APS 1-ID Beamline
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- 20 May 2016, p. 167
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D-7 Invited—Deformation Mechanisms in Amorphous and Nanocrystalline Metals Meaured by in Situ X-ray Diffraction
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- 20 May 2016, p. 167
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D-48 Investigation of Surface Structures by Powder Diffraction: A Differential Pair Distribution Function (PDF) Study into Arsenate Sorption on Ferrihydrite
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- 20 May 2016, p. 167
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D-80 In-Situ Observation of Dynamic Recrystallization and Related Phenomena in the Bulk of Zirconium Alloy
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- 20 May 2016, p. 167
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D-75 Measuring and Modeling Deformation Partitioning in Titanium Alloys
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- 20 May 2016, p. 167
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F-39 Invited—TXRF-XANES and GI-XAS: X-ray Absorption Spectroscopy in Trace Analysis
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- 20 May 2016, p. 167
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F-60 Portable XRF for FDA Field Investigators: A Review of Some Recent Investigations and Applications
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- 20 May 2016, p. 168
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F-24 Solving Forensics Mysteries with the XRF Microscope
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- 20 May 2016, p. 168
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F-27 Water Analysis Using a Prototype Monochromatic Microfocus Grazing Incidence X-ray Fluorescence Device Comparing Picoliter and Nanoliter Deposition as Sample Preparation Approach
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- 20 May 2016, p. 168
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F-75 Trace Element Analysis of Micro-XRF by Pinpoint Concentration Method
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- 20 May 2016, p. 168
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F-5 Portable Total Reflection X-ray Fluorescence Spectrometer: Comparison Between Non-Monochromatic and Monochromatic X-ray Sources
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- 20 May 2016, p. 168
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F-33 Filtered Two Color X-ray Microbeams for Enhancement in Sensitivity of Light Elements
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- 20 May 2016, p. 168
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F-48 TXRF Analysis of Multiple Droplet Residues
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- 20 May 2016, p. 168
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F-51 Trace Element Analysis of Dietary Supplements and Nutrients by TXRF
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- 20 May 2016, p. 168
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F-56 Depth Analysis with Bench-Top TXRF Instrument
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- 20 May 2016, p. 168
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C-13 Invited—Overview of X-ray Imaging at NSLS-II
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- 20 May 2016, p. 168
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C-7 Synchrotron-Based Radioscopy with Spatio-Temporal Micro-Resolution Using Hard X-rays
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- 20 May 2016, p. 168
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