Powder Diffraction: Volume 24 - Issue 2

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

URL: /core/journals/powder-diffraction
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Volume 24 - Special Issue 2 - June 2009

Contents

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Denver X-Ray Conference

F-57 Invited—Considerations on Calibration and Prediction in Quantitative X-ray Fluorescence Analysis
P. Van Espen
Published online by Cambridge University Press:

20 May 2016, p. 170
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F-66 Comparison of Various XRF Quantitative Methods for Determination of Toxic Elements in Supplements
P.T. Palmer, J. Hamdani, R. Jacobs
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20 May 2016, p. 170
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F-44 ASTM D 6247 Determination Elemental Content of Polyolefins by X-ray Fluorescence Spectrometry—Validation of the Revised Standard
J.R. Sieber
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20 May 2016, p. 170
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F-42 Traditional Empirical WDXRF Calibration Compared with Using The Calibration Tool Multiscat®: Applications Shown on for Metal Bases
S. Bäckman, I. Bernhardsson
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20 May 2016, p. 170
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F-9 Combined Multiple-Excitation FP Method For Micro-XRF Analysis of Difficult Samples
W.T. Elam, B. Scruggs, J. Nicolosi
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20 May 2016, p. 170
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F-45 SRM 2855 Additive Elements in Polyethylene WDXRF Analyses and Certification Approach
J.R. Sieber
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20 May 2016, p. 171
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F-43 Oxidic Calibration Using WDXRF-Multiscat®: Applications Shown for Minerals, Ore Concentrates And Slags
S. Bäckman, I. Bernhardsson
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20 May 2016, p. 171
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F-31 Classes of Materials (COM)—A Tool for Analysis and Material Identification
J. Kessler, V. Roßiger, M. Haller
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20 May 2016, p. 171
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F-54 Stardust Cometary Matter Analyzed By Synchrotron Nano-XRF: New Results and Developments
T. Schoonjans, B. Vekemans, G. Silversmit, L. Vincze, S. Schmitz, F. Brenker
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20 May 2016, p. 171
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F-64 L Shell X-ray Fluorescence Cross-Sections for Elements with 33 ≤ Z ≤ 50
V. Sharma, N. Singh, S. Kumar
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20 May 2016, p. 171
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D-15 Invited—Laboratory-Based Characterization of Heteroepitaxial Structures: Advanced Experiments Not Needing Synchrotron Radiation
P. Zaumseil
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20 May 2016, p. 171
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D-67 High-Resolution X-ray Diffraction Data Analysis From The Partly Relaxed Semiconductor Structures
A. Ulyanenkov, A. Benediktovitch, I. Feranchuk, B. He, H. Ress
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20 May 2016, p. 171
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D-59 Spatially Resolved Determination of Stress in Thin Films and Devices from Curvature Measurements
N. Herres
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20 May 2016, p. 171
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D-57 NIST SRM 2000—A High Resolution X-ray Diffraction Standard Reference Material
D. Windover, D.L. Gil, A. Henins, J.P. Cline
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20 May 2016, p. 171
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D-89 Invited—Six Ways of Determining Film Thickness from High Resolution XRD Data
A.J. Ying, I.C. Noyan, C.E. Murray
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20 May 2016, p. 171
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D-28 High-Resolution X-ray Scattering Methods for the Structural Characertization of Epitaxial Nitride Structures
J.F. Woitok
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20 May 2016, p. 171
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D-87 Grazing Incidence In-Plane X-ray Diffraction from Epitaxial Fe/MgO/Fe and Fe/Au/MgO/Fe Tunnel Junctions
D.S. Eastwood, M. Abes, B.K. Tanner, T.P.A. Hase, M. Ali, B.J. Hickey
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20 May 2016, p. 171
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D-86 Invited—Structure Solution and Refinement Approaches for Oxide Ceramics
S.T. Misture
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20 May 2016, p. 171
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D-54 Charge-Flipping Structure Solution from Single Crystal and Powder Diffraction Data
A. Kern, A.A. Coelho
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20 May 2016, p. 171
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D-65 Powder Diffraction for Characterization and Development of Oxide Fuels
H.M. Volz, C.R. Stanek, E.P. Luther, J.T. Dunwoody, R.M. Dickerson, K.J. McClellan, S.C. Vogel, D.A. Weldon, D.R. Coughlin, D.D. Byler
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20 May 2016, p. 172
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Page 7 of 8

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Powder Diffraction

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Volume 24 - Special Issue 2 - June 2009

Denver X-Ray Conference

F-57 Invited—Considerations on Calibration and Prediction in Quantitative X-ray Fluorescence Analysis

F-66 Comparison of Various XRF Quantitative Methods for Determination of Toxic Elements in Supplements

F-44 ASTM D 6247 Determination Elemental Content of Polyolefins by X-ray Fluorescence Spectrometry—Validation of the Revised Standard

F-42 Traditional Empirical WDXRF Calibration Compared with Using The Calibration Tool Multiscat®: Applications Shown on for Metal Bases

F-9 Combined Multiple-Excitation FP Method For Micro-XRF Analysis of Difficult Samples

F-45 SRM 2855 Additive Elements in Polyethylene WDXRF Analyses and Certification Approach

F-43 Oxidic Calibration Using WDXRF-Multiscat®: Applications Shown for Minerals, Ore Concentrates And Slags

F-31 Classes of Materials (COM)—A Tool for Analysis and Material Identification

F-54 Stardust Cometary Matter Analyzed By Synchrotron Nano-XRF: New Results and Developments

F-64 L Shell X-ray Fluorescence Cross-Sections for Elements with 33 ≤ Z ≤ 50

D-15 Invited—Laboratory-Based Characterization of Heteroepitaxial Structures: Advanced Experiments Not Needing Synchrotron Radiation

D-67 High-Resolution X-ray Diffraction Data Analysis From The Partly Relaxed Semiconductor Structures

D-59 Spatially Resolved Determination of Stress in Thin Films and Devices from Curvature Measurements

D-57 NIST SRM 2000—A High Resolution X-ray Diffraction Standard Reference Material

D-89 Invited—Six Ways of Determining Film Thickness from High Resolution XRD Data

D-28 High-Resolution X-ray Scattering Methods for the Structural Characertization of Epitaxial Nitride Structures

D-87 Grazing Incidence In-Plane X-ray Diffraction from Epitaxial Fe/MgO/Fe and Fe/Au/MgO/Fe Tunnel Junctions

D-86 Invited—Structure Solution and Refinement Approaches for Oxide Ceramics

D-54 Charge-Flipping Structure Solution from Single Crystal and Powder Diffraction Data

D-65 Powder Diffraction for Characterization and Development of Oxide Fuels

Powder Diffraction

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Volume 24 - Special Issue 2 - June 2009

Denver X-Ray Conference