Different experimental conditions at a versatile high-energy beamline equipped with a two-dimensional detector have been compared for powder diffraction and pair distribution function (PDF) experiments. In particular, sample size and sample to detector distances have been evaluated on a standard sample, to evaluate their effects in both Q and real space. Two illustrative cases are also discussed. The average structure and local distortions in a BaTiO3 powder with 100 nm particle size show that spurious ripples in the PDF are suppressed by increased counting statistics. Effects of small amounts of a crystalline impurity phase on a SiO2.Al2O3.Na2O.CaO glass have been quantified.

A powder diffraction measurement system constructed on a beam-line BL5S2 at Aichi Synchrotron Radiation Center in Seto, Japan, has been modified for extensive use of two-dimensional (2D) X-ray detectors. Four flat 2D detectors are currently mounted on the movable stages on supporting rods radially attached to the 2Θ-wheel of the goniometer with the interval of 25°. The 2D powder diffraction intensity data are reduced to conventional 1D format of powder diffraction data by the method based on averaging of the pixel intensities with geometrical corrections, which also enables evaluation of standard uncertainties about the reduced intensity data. The 1D powder diffraction data of a 0.1 mm-capillary LaB6 (NIST SRM660b) sample obtained at the camera length of 340 mm have shown almost symmetric peak profile with slight asymmetry simulated by a beta-distribution profile function.

Two-dimensional X-ray diffraction (XRD2) pattern can be described by the diffraction intensity distribution in both 2θ and γ-directions. The XRD2 images can be reduced to two kinds of profiles: 2θ-profile and γ-profile. The 2θ-profile can be evaluated for phase identification, crystal structure refinement, and many applications with many existing algorithms and software. In order to evaluate the materials structure associated with the intensity distribution along γ-angle, either the XRD2 pattern should be directly analyzed or the γ-profile can be generated by 2θ-integration. A γ-profile contains information on texture, stress, crystal size, and crystal orientation relations. This paper introduces the concept and fundamental algorithms for stress, texture, and crystal size analysis by the γ-profile analysis.

The viability of the direct-space strategy TALP (Vallcorba et al., 2012b) to solve crystal structures of molecular compounds from laboratory powder diffraction data is shown. The procedure exploits the accurate metric refined from a ‘Bragg-Brentano’ powder pattern to extract later the intensity data from a second ‘texture-free’ powder pattern with the DAJUST software (Vallcorba et al., 2012a). The experimental setup for collecting this second pattern consists of a circularly collimated X-ray beam and a 2D detector. The sample is placed between two thin Mylar® foils, which reduces or even eliminates preferred orientation. With the combination of the DAJUST and TALP software a preliminary but rigorous structural study of organic compounds can be carried out at the laboratory level. In addition, the time-consuming filling of capillaries with diameters thinner than 0.3mm is avoided.