Thick and Thin Films: Standards and Analysis
Characterization of SiGe Films for Use as a National Institute of Standards and Technology Microanalysis Reference Material (RM 8905)
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- 24 December 2009, pp. 1-12
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Electron-Beam-Induced Carbon Contamination on Silicon: Characterization Using Raman Spectroscopy and Atomic Force Microscopy
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- 24 December 2009, pp. 13-20
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Electron Probe Microanalysis of Thin Films and Multilayers Using the Computer Program XFILM
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- 24 December 2009, pp. 21-32
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Biological Imaging: Techniques Development and Applications
Colloidal Palladium Particles of Different Shapes for Electron Microscopy Labeling
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- 24 December 2009, pp. 33-42
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Cryomesh™: A New Substrate for Cryo-Electron Microscopy
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- 18 January 2010, pp. 43-53
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Three-Dimensional Scanning Transmission Electron Microscopy of Biological Specimens
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- 18 January 2010, pp. 54-63
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Visualization of Localization Microscopy Data
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- 18 January 2010, pp. 64-72
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Fractal and Image Analysis of the Microvasculature in Normal Intestinal Submucosa and Intestinal Polyps in ApcMin/+ Mice
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- 24 December 2009, pp. 73-79
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Neural Differentiation of Human Embryonic Stem Cells at the Ultrastructural Level
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- 18 January 2010, pp. 80-90
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A Layered Structure in the Organic Envelopes of the Prismatic Layer of the Shell of the Pearl Oyster Pinctada margaritifera (Mollusca, Bivalvia)
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- 24 December 2009, pp. 91-98
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Atom Probe Tomography
Spatial Resolution in Atom Probe Tomography
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- 18 January 2010, pp. 99-110
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Book Review
Transmission Electron Microscopy: A Textbook for Materials Science, Second Edition. David B. Williams and C. Barry Carter. Springer, New York, 2009, 932 pages. ISBN 978-0-387-76500-6 (Hardcover), ISBN 978-0-387-76502-0 (Softcover)
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- 04 January 2010, p. 111
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Calendar
Calendar of Meetings and Courses
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- 18 January 2010, pp. 112-115
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Front Cover (OFC, IFC) and matter
MAM volume 16 issue 1 Cover and Front matter
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- 18 January 2010, pp. f1-f9
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Back Cover (IBC, OBC) and matter
MAM volume 16 issue 1 Cover and Back matter
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- 18 January 2010, pp. b1-b3
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