Technical Feature
Order and Disorder in Semiconductors*
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- 29 November 2013, pp. 43-49
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In Situ, Real-Time Characterization of Thin-Film Growth Processes
Total-Reflection X-Ray Fluorescence Spectroscopy for In Situ, Real-Time Analysis of Growing Films
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- 29 November 2013, pp. 43-46
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Organic Thin Films
Supramolecular Assemblies of Chromophores in LB Films and Related Media
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- 29 November 2013, pp. 39-45
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Education Exchange
General Atomics Enhances Pre-College Science Education
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- 29 November 2013, pp. 48-49
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Defects in Polymers
Defect-Mediated Rheology of Block Copolymers
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- 29 November 2013, pp. 42-46
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Technical Features
Substrate Selection for Thin-Film Growth
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- 29 November 2013, pp. 35-39
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Functionally Gradient Materials
Hierarchical Functionally Gradient Structures of Bamboo, Barley, and Corn
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- 29 November 2013, pp. 35-36
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Silicon-Based Ceramics
Unique Microstructural Development in SiC Materials with High Fracture Toughness
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- 29 November 2013, pp. 42-45
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Materials in Musical Instruments
Bass Handbells of Aluminum
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- 29 November 2013, pp. 40-43
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Metallization for Integrated Circuit Manufacturing
Aluminum Reflow Sputtering
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- 29 November 2013, pp. 53-56
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Special Feature
Electronic Access to Factual Materials Information: The State of the Art
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- 29 November 2013, pp. 40-48
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Magnetism on a Microscopic Scale
Surface Magnetism and Kerr Spectroscopy
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- 29 November 2013, pp. 34-37
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Technical Features
Modeling Diffusion in Gallium Arsenide: Recent Work
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- 29 November 2013, pp. 41-50
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Functionally Gradient Materials
Fundamentals of Residual Stresses in Joints Between Dissimilar Materials
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- 29 November 2013, pp. 37-39
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Historical Note
Early Materials Launched Modem-Day Spacecraft Capabilities
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- 29 November 2013, p. 50
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Materials in Musical Instruments
The Caribbean Steel Pan: Tuning and Mode Studies
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- 29 November 2013, pp. 44-46
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News
University Chapter News
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- 29 November 2013, p. 49
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Magnetism on a Microscopic Scale
SPLEEM of Magnetic Surfaces and Layered Structures
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- 29 November 2013, pp. 38-40
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In Situ, Real-Time Characterization of Thin-Film Growth Processes
Real-Time Monitoring of Epitaxial Processes by Parallel-Polarized Reflectance Spectroscopy
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- 29 November 2013, pp. 49-55
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Defects in Polymers
Chain-End Defects in Extended-Chain Polymer Solids
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- 29 November 2013, pp. 47-51
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