Powder Diffraction: Volume 25 - Issue 2

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 25 - Issue 2 - June 2010

Contents

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Denver X-Ray Conference

D-74 Invited— High-Resolution Powder X-ray Diffraction Study of Complex Minerals
S. M. Antao
Published online by Cambridge University Press:

20 May 2016, p. 216
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D-22 Crystal Structures of BaSrR4Zn2O10, R = La, Nd, Sm, Eu
J. A. Kaduk, W. Wong-Ng
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20 May 2016, p. 217
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D-60 Detection and Quantification of Passivation Layers in Electrochemical Inert Anodes by In-Situ and Ex-Situ Diffraction
M. R. Rowles, K. McGregor, G. A. Snook, I. C. Madsen, N.V.Y. Scarlett, M. Lanyon, A. Urban, M. J. Styles, D. P. Riley
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20 May 2016, p. 217
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C-6 Characterization of X-ray Powder Diffraction Data of BaxSr1−xSo4 (0≤x≤1) by Rietveld Refinement
S. R. Zaidi, H. Sitepu, S. Shen, N. Al-Yami
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20 May 2016, p. 217
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D-77 XRD Anisotropic Broadening of Nano-Particles
Y. Wang, S. L. I. Chan, Y. R. Shen, R. Amal, K. Kiatkittipong
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20 May 2016, p. 217
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D-19 Differences between Near-Surface and Bulk Preferred Orientation with Powder Diffraction Data of Molybdite (MoO3) and Calcite (CaCo3)
H. Sitepu, B. H. O'Connor, D. Li
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20 May 2016, p. 217
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D-13 Computational Texture Analysis with MTEX
R. Hielscher, F. Bachmann, H. Schaeben
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20 May 2016, p. 217
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D-20 Invited—Three Dimensional X-ray Diffraction Microscopy
L. Margulies, H. F. Poulsen, S. Schmidt, D. J. Jensen, G. Vaughan, J. Wright
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20 May 2016, p. 217
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D-30 Invited—Nanoscale Scanning Probe Diffraction Microscopy at the Hard X-ray Nanoprobe Beamline
M. Holt, S. Hruszkewycz, R. Winarski, V. Rose, J. Maser
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20 May 2016, p. 217
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D-81 Multi-Dimensional X-ray Investigation of Materials—Ranging from Classical Bragg-Brentano Type Diffraction Phase Analysis to 3 Dimensional CT Microstructure Analysis
H. Pöllmann, R. Maier, U. Riedl, G. Blaj
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20 May 2016, p. 217
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D-73 High Resolution X-ray Diffraction of III-Nitride Wide Bandgap Semiconductors
Q. Sun, B. Leung, J. Han
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20 May 2016, p. 218
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D-17 High-Resolution Reciprocal Space Mapping of InGaAs/GaAs Structures: From Pseudomorphic to Fully Relaxed State
A. Ulyanenkov, F. Rinaldi, S. Menzel, A. Benediktovich, A. Zhilik, I. Feranchuk, K. Saito
Published online by Cambridge University Press:

20 May 2016, p. 218
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D-36 In-Plane Diffraction Analysis for Twist/Twin Structure of Non-Polar A-Plane GaN
Y. -i. Jang, K. -h. Park, K. -h. Bang
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20 May 2016, p. 218
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D-1 Effect of Substrate Temperature on the Structural, Optical and Electrical Properties of Silver Indium Selenide Films Prepared by Laser Ablation
D. Pathak, R. K. Bedi, D. Kaur
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20 May 2016, p. 218
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F-22 Invited— X-ray Absorption Imaging for Analysis of Gas Discharges in Energy-Efficient Lighting
J. J. Curry
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20 May 2016, p. 218
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F-3 STXM Imaging of Organic Coatings on Grains in Primitive Interplanetary Dust: Implications for Formation of Pre-Biotic Organic Matter and Grain Sticking in the Early Solar System
G. J. Flynn, S. Wirick, C. Jacobsen, L. P. Keller, S. A. Sandford
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20 May 2016, p. 218
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F-37 Macroscopic X-ray Fluorescence Capability for Large-Scale Elemental Mapping
H. M. Volz, G. J. Havrilla, R. M. Aikin, Jr., V. M. Montoya, A. N. Duffield
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20 May 2016, p. 218
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F-29 Overlay of Laboratory-Based 3D X-ray Imaging Systems
B. M. Patterson, G. J. Havrilla, B. Jackson
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20 May 2016, p. 218
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F-26 Invited—X-ray Chemical Imaging in Scanning and Projection Modes in the Laboratory
K. Tsuji, K. Nakano
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20 May 2016, p. 218
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D-28 High Speed 3D Diffraction Imaging
J. P. O. Evan, J. W. Chan, S. X. Godber, I. Peatfield, K. D. Rogers, A. Dicken, J. Rogers
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20 May 2016, p. 219
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Page 6 of 8

First
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2
3
4
5
6
7
8
Next »
Last

Powder Diffraction

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Volume 25 - Issue 2 - June 2010

Denver X-Ray Conference

D-74 Invited— High-Resolution Powder X-ray Diffraction Study of Complex Minerals

D-22 Crystal Structures of BaSrR4Zn2O10, R = La, Nd, Sm, Eu

D-60 Detection and Quantification of Passivation Layers in Electrochemical Inert Anodes by In-Situ and Ex-Situ Diffraction

C-6 Characterization of X-ray Powder Diffraction Data of BaxSr1−xSo4 (0≤x≤1) by Rietveld Refinement

D-77 XRD Anisotropic Broadening of Nano-Particles

D-19 Differences between Near-Surface and Bulk Preferred Orientation with Powder Diffraction Data of Molybdite (MoO3) and Calcite (CaCo3)

D-13 Computational Texture Analysis with MTEX

D-20 Invited—Three Dimensional X-ray Diffraction Microscopy

D-30 Invited—Nanoscale Scanning Probe Diffraction Microscopy at the Hard X-ray Nanoprobe Beamline

D-81 Multi-Dimensional X-ray Investigation of Materials—Ranging from Classical Bragg-Brentano Type Diffraction Phase Analysis to 3 Dimensional CT Microstructure Analysis

D-73 High Resolution X-ray Diffraction of III-Nitride Wide Bandgap Semiconductors

D-17 High-Resolution Reciprocal Space Mapping of InGaAs/GaAs Structures: From Pseudomorphic to Fully Relaxed State

D-36 In-Plane Diffraction Analysis for Twist/Twin Structure of Non-Polar A-Plane GaN

D-1 Effect of Substrate Temperature on the Structural, Optical and Electrical Properties of Silver Indium Selenide Films Prepared by Laser Ablation

F-22 Invited— X-ray Absorption Imaging for Analysis of Gas Discharges in Energy-Efficient Lighting

F-3 STXM Imaging of Organic Coatings on Grains in Primitive Interplanetary Dust: Implications for Formation of Pre-Biotic Organic Matter and Grain Sticking in the Early Solar System

F-37 Macroscopic X-ray Fluorescence Capability for Large-Scale Elemental Mapping

F-29 Overlay of Laboratory-Based 3D X-ray Imaging Systems

F-26 Invited—X-ray Chemical Imaging in Scanning and Projection Modes in the Laboratory

D-28 High Speed 3D Diffraction Imaging

Powder Diffraction

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Volume 25 - Issue 2 - June 2010

Denver X-Ray Conference