Powder Diffraction: Volume 25 - Issue 2

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 25 - Issue 2 - June 2010

Contents

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Denver X-Ray Conference

F-47 Invited—X-ray Fluorescence Spectrometry in the Environmental Field: A Review of Some Recent Investigations and Applications
E. Margui, I. Queralt, M. Hidalgo, R. Van Grieken
Published online by Cambridge University Press:

20 May 2016, p. 214
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F-7 Characterization of Silicon Drift Detectors for EDXRF
R. Redus, T. Pantazis, J. Pantazis, A. Huber
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20 May 2016, p. 214
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F-39 Invited— Micro-XRF Analysis of Metal Alloys: From the Laboratory Calibration Towards In-Situ Analyses
A. G. Karydas, V. Kantarelou, D. Sokaras, D. Wegrzynek, E. Chinea-Cano, A. Markowicz, P. Wobrauschek, C. Streli, K. Uhlir, M. Griesser
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20 May 2016, p. 214
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F-55 Indoor Air Quality in Brazilian Schools Nearby Industries: The Case of Curitiba
R. H. M. Godoi, A. F. L. Godoi, M. G. Arantes, S. J. Gonçalves, Jr, L. C. Stroppa, R. Alves, J. E. Ferreira da Costa Gardolinski, J. Manoel dos Reis Neto, E. M. Fortunato de Lucena Reynaldo, B. Alfody, Y. Makarovska, R. Van Grieken
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20 May 2016, p. 215
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F-60 XRS for Preventive Conservation of Cultural Heritage
R. Van Grieken
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20 May 2016, p. 215
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F-18 Invited—Analytical Strategy for Compositional and Layer Thickness Analysis of Copper-Indium-Gallium-Selenium on Molybdenum Coated Glass Substrates
L. L. Brehm, T. T. Hasan, D. A. Libby, T. R. Bryden
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20 May 2016, p. 215
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C-4 XANES Based Quantitative Phase Analysis in Cu2ZnSnS4
H. D. Rosenfeld
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20 May 2016, p. 215
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F-4 Quantification of Two-Polymeric Phases in Paint Formulation by X-ray Fluorescence and X-ray Photoelectron Spectroscopy
P. Ricou, R. Gupta
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20 May 2016, p. 215
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F-11 Glancing Versus Normal XRF Excitation with Monochromatic and Polychromatic Radiation for the Composition Analysis of SmCo Based Films on Silicon Wafers
F. J. Cadieu, I. Vander, R. W. Zuneska
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20 May 2016, p. 215
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F-61 Depth-Resolved Speciation of Buried Nanolayers
B. Pollakowski, B. Beckhoff
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20 May 2016, p. 215
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F-66 Investigation of Spin-Coated Inorganic Contamination on Si Surfaces by Various Analytical Techniques
B. Beckhoff, M. Kolbe, M. Müller, A. Nutsch, R. Altmann, G. Borionetti, C. Pello, M. L. Polignano, D. Codegoni, S. Grasso, E. Cazzini, M. Bersani, P. Lazzeri, S. Gennaro, P. Kregsamer, F. Posch
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20 May 2016, p. 215
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F-41 X-ray Fluorescence Analysis of Palladium in Non-Homogeneous Organics and Slurries via Gel Suspensions
D. W. Burns, Y. Yang, S. Yusuf, D. G. Coler
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20 May 2016, p. 215
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F-13 Advantages and Disadvantages of Bayesian Methods for Obtaining XRF Net Intensities
W. T. Elam, B. Scruggs, F. Eggert, J. Nicolosi
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20 May 2016, p. 215
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F-54 Development of Quantification Method Using Fundamental Parameter Method for EDXRF
S. Hara, N. Kawahara, T. Matsuo, M. Doi
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20 May 2016, p. 216
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F-59 Characterization of Gemstones by Multiple Excitation EDXRF
M. Haller, V. Rößiger, A. Peretti, D. Günther
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20 May 2016, p. 216
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F-19 Invited—Analysis of Meissen Ceramics from the Hoffmeister Collection by HH-XRF
A. J. Shortland, K. Domoney, S. Kuhn
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20 May 2016, p. 216
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C-8 Invited—Analyzing Stratigraphy with a Dual XRD/XRF Instrument
G. Chiari
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20 May 2016, p. 216
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D-3 An Archaeologist's Dilemma
K. D. Rogers, S. Beckett, S. Kuhn, A. Chamberlain, J. Clement
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20 May 2016, p. 216
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F-50 Invited—Incorporating the Concept of Secondary Targets in Handheld X-ray Fluorescence to Increase Sensitivity of Minor Elements
C. McGlinchey, B. Kaiser, T. Howe
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20 May 2016, p. 216
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F-79 Characterization of Silver Gelatin Fiber Based Photographic Papers using X-ray Fluorescence Spectroscopy
A. Martins, C. McGlinchey, L. A. Daffner, P. Messier, A. Chapman
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20 May 2016, p. 216
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Page 5 of 8

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4
5
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Powder Diffraction

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Volume 25 - Issue 2 - June 2010

Denver X-Ray Conference

F-47 Invited—X-ray Fluorescence Spectrometry in the Environmental Field: A Review of Some Recent Investigations and Applications

F-7 Characterization of Silicon Drift Detectors for EDXRF

F-39 Invited— Micro-XRF Analysis of Metal Alloys: From the Laboratory Calibration Towards In-Situ Analyses

F-55 Indoor Air Quality in Brazilian Schools Nearby Industries: The Case of Curitiba

F-60 XRS for Preventive Conservation of Cultural Heritage

F-18 Invited—Analytical Strategy for Compositional and Layer Thickness Analysis of Copper-Indium-Gallium-Selenium on Molybdenum Coated Glass Substrates

C-4 XANES Based Quantitative Phase Analysis in Cu2ZnSnS4

F-4 Quantification of Two-Polymeric Phases in Paint Formulation by X-ray Fluorescence and X-ray Photoelectron Spectroscopy

F-11 Glancing Versus Normal XRF Excitation with Monochromatic and Polychromatic Radiation for the Composition Analysis of SmCo Based Films on Silicon Wafers

F-61 Depth-Resolved Speciation of Buried Nanolayers

F-66 Investigation of Spin-Coated Inorganic Contamination on Si Surfaces by Various Analytical Techniques

F-41 X-ray Fluorescence Analysis of Palladium in Non-Homogeneous Organics and Slurries via Gel Suspensions

F-13 Advantages and Disadvantages of Bayesian Methods for Obtaining XRF Net Intensities

F-54 Development of Quantification Method Using Fundamental Parameter Method for EDXRF

F-59 Characterization of Gemstones by Multiple Excitation EDXRF

F-19 Invited—Analysis of Meissen Ceramics from the Hoffmeister Collection by HH-XRF

C-8 Invited—Analyzing Stratigraphy with a Dual XRD/XRF Instrument

D-3 An Archaeologist's Dilemma

F-50 Invited—Incorporating the Concept of Secondary Targets in Handheld X-ray Fluorescence to Increase Sensitivity of Minor Elements

F-79 Characterization of Silver Gelatin Fiber Based Photographic Papers using X-ray Fluorescence Spectroscopy

Powder Diffraction

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Volume 25 - Issue 2 - June 2010

Denver X-Ray Conference