Powder Diffraction: Volume 20 - Issue 2

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 20 - Issue 2 - June 2005

Contents

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Denver X-Ray Conference

D092 Applications of Parallel Beam Optics at Elevated Temperatures—Invited
T.R. Watkins
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20 May 2016, p. 184
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F35 Towards Three-Dimensional Trace Element Microscopic XRF Analysis—Invited
B. Vekemans, K. Janssens, L. Vincze
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20 May 2016, p. 184
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F27 Confocal Micro X-ray Fluorescence Microscope: Performance Capabilities
E.P. Hastings, G.J. Havrilla
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20 May 2016, p. 184
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F51 Comparison of X-ray Beam Forming Optics for Micro X-ray Fluorescence
G.J. Havrilla, E.P. Hastings, B. Patterson, V. Montoya
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20 May 2016, p. 184
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F29 Nanometer Multilayers as Monochromators for the X-ray Fluorescence Analysis
S. Braun, T. Foltyn, W. Friedrich, A. Leson, R. Dietsch, D. Weissbach
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20 May 2016, p. 184
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D093 XRD Data Quality—About the Art to Configure the Optimum Diffraction System
L. Brügemann, A. Kern, H.-G. Krane, O. Bahr
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20 May 2016, p. 184
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D073 Calculating Sample Displacement from Patterns with Different Fixed Incident Angles
J.M. Neil, A. Navrotsky, H. Pilliere
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20 May 2016, p. 184
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D072 A New Area Detector for High-Speed and High-Sensitivity X-ray Diffraction Analysis—Invited
T. Taguchi
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20 May 2016, p. 185
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D094 Detectors for X-ray Diffraction and Scattering: Current Status and Future Challenges
L. Brügemann, E. Gerndt, A. Kern, H.-G. Krane, Y. Diawara, B. He
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20 May 2016, p. 185
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F38 Silicon Multi-Cathode Detector (SMCD) Developments for High-Speed XRF Analysis
S. Barkan, J.S. Iwanczyk, V.D. Saveliev, C.R. Tull, L. Feng, B.E. Patt
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20 May 2016, p. 185
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F25 Optimized Readout Methods of Silicon Drift Detectors for High Resolution, High Count Rate X-ray Spectroscopy
A. Niculae, H. Soltau, P. Lechner, G. Lutz, L. Strüder, C. Fiorini, A. Longoni
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20 May 2016, p. 185
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F26 Large Area Silicon Drift Detectors for X-ray Spectroscopy
A. Niculae, H. Soltau, P. Lechner, R. Eckhard, G. Lutz, L. Strüder, G. Schaller, F. Schopper, C. Fiorini, A. Longoni
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20 May 2016, p. 185
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C04 100 mm2 Silicon Drift Detectors with Discrete First Fet
P. Goldstrass, J. Kemmer, O. Boslau, T. Eggert, A. Pahlke, F. Wiest
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20 May 2016, p. 185
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F42 Quantitative Energy-Dispersive Electron Probe X-ray Microanalysis of Individual Particles—Invited
C.-U. Ro
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20 May 2016, p. 186
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F30 Micro-XRF Analysis of Biological Materials—Invited
K. Tsuji, K. Nakano, K. Tanaka, A. Okhrimovskyy, Y. Konishi, X. Ding
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20 May 2016, p. 186
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F64 Energy Dispersive X-ray Microanalysis of Hot Particles—Invited
S. Török, A. Alsecz, J. Osán, N. Vajda
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20 May 2016, p. 186
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F18 Micro X-ray Fluorescence as a High Throughput, Double Combinatorial Screening Tool
E.M. Minogue, T.P. Taylor, G.J. Havrilla
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20 May 2016, p. 186
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F21 Abnormal X-ray Emission from Insulators Bombarded with Low Energy Ions
M. Song, K. Mitsuishi, M. Takeguchi, K. Furuya, R.C. Birtcher
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20 May 2016, p. 186
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F37 A Comparison of EDXRF and Raman Chemical Imaging for use in Formulation Process Development and Quality Control
A. Whitley, S. Mamedov, F. Adar, F. Clarke
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20 May 2016, p. 186
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F39 Total EDXRF Assay of Plastics Exploiting Non-Sherman Volumetric Effects
A.J.-C. Lee, P.J. Ramadge, B. Hubbard-Nelson, D.I. Feinstein
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20 May 2016, p. 186
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Page 7 of 8

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Powder Diffraction

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Volume 20 - Issue 2 - June 2005

Denver X-Ray Conference

D092 Applications of Parallel Beam Optics at Elevated Temperatures—Invited

F35 Towards Three-Dimensional Trace Element Microscopic XRF Analysis—Invited

F27 Confocal Micro X-ray Fluorescence Microscope: Performance Capabilities

F51 Comparison of X-ray Beam Forming Optics for Micro X-ray Fluorescence

F29 Nanometer Multilayers as Monochromators for the X-ray Fluorescence Analysis

D093 XRD Data Quality—About the Art to Configure the Optimum Diffraction System

D073 Calculating Sample Displacement from Patterns with Different Fixed Incident Angles

D072 A New Area Detector for High-Speed and High-Sensitivity X-ray Diffraction Analysis—Invited

D094 Detectors for X-ray Diffraction and Scattering: Current Status and Future Challenges

F38 Silicon Multi-Cathode Detector (SMCD) Developments for High-Speed XRF Analysis

F25 Optimized Readout Methods of Silicon Drift Detectors for High Resolution, High Count Rate X-ray Spectroscopy

F26 Large Area Silicon Drift Detectors for X-ray Spectroscopy

C04 100 mm2 Silicon Drift Detectors with Discrete First Fet

F42 Quantitative Energy-Dispersive Electron Probe X-ray Microanalysis of Individual Particles—Invited

F30 Micro-XRF Analysis of Biological Materials—Invited

F64 Energy Dispersive X-ray Microanalysis of Hot Particles—Invited

F18 Micro X-ray Fluorescence as a High Throughput, Double Combinatorial Screening Tool

F21 Abnormal X-ray Emission from Insulators Bombarded with Low Energy Ions

F37 A Comparison of EDXRF and Raman Chemical Imaging for use in Formulation Process Development and Quality Control

F39 Total EDXRF Assay of Plastics Exploiting Non-Sherman Volumetric Effects

Powder Diffraction

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Volume 20 - Issue 2 - June 2005

Denver X-Ray Conference