Powder Diffraction: Volume 19 - Issue 2

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 19 - Issue 2 - June 2004

Contents

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Denver X-Ray Conference

F-1 WDXRF Analysis of Thin Layers—Invited
M. W. Dirken
Published online by Cambridge University Press:

20 May 2016, p. 194
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C-5 Miniature X-ray Tubes Utilizing Carbon Nanotube-Based Cold Cathodes
A. Reyes-Mena, D. Clark Turner, E. Bard, C. Jensen, Q. Qiu, B. Gao, J. Lu, O. Zhou
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20 May 2016, p. 194
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F-41 New Sequential XRF: Performance Improvements Through Innovative Design
A. Buman, R. Yellepeddi
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20 May 2016, p. 194
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F-55 Equa All—The New Standardless Solution for Energy Dispersive X-ray Fluorescence
K. Behrens, K. Mauser
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20 May 2016, p. 194
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F-45 Diffractive Kirkpatrick-Baez Optic for Micro X-ray Fluorescence
B. Verman, B. Kim, D. Wilcox, R. Samokyszyn, L. Jiang
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20 May 2016, p. 194
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F-46 Bench Top X-ray Fluorescence Spectrometers based on Orthogonal and Total Reflection Geometry for Excitation
R. E. Ayala Jiménez
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20 May 2016, p. 194
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D-48 Automation in Research and Production Using X-ray Powder Diffraction
J. P. Nicolich
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20 May 2016, p. 194
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D-104 Bruker AXS Super Speed Solutions for X-ray Diffraction Applications
U. Preckwinkel, B. He, L. Bruegemann
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20 May 2016, p. 194
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D-90 SWAXS System-3 : The New Generation of Automated Small- and Wide-Angle X-ray Systems
P. Laggner, R. Koschuch, M. Kriechbaum
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20 May 2016, p. 194
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D-61 Grazing-Incident X-ray Diffraction Analyses of Novel Magnetic Thin Films—Invited
K. Inaba, Y. Ito, K. Omote, H. Toraya
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20 May 2016, p. 195
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D-12 Ultra-Fast Simultaneous Fitting of Several Bragg Reflections from ALAs/GaAs Superlattices Using Method of Eigenwaves
A. Ulyanenkov, R. Eisenhower, I. Feranchuk, H. Guérault, H. Ress
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20 May 2016, p. 195
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D-5 The Direct Determination of X-ray Diffraction Data from Specific Depths
A. Broadhurst, K. D. Rogers, D. W. Lane, T. W. Lowe
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20 May 2016, p. 195
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D-70 “BaF2 Process”: Phase Evolution of Ba2YCu3O6+x Films
W. Wong-Ng, I. Levin, M. D. Vaudin, L. P. Cook, R. Feenstra
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20 May 2016, p. 195
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D-89 In-Situ HTXRD Characterization for Thin Films
E. A. Payzant, S. A. Speakman
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20 May 2016, p. 195
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D-108 In Situ Studies of Nano-Particle Growth in Flames—Invited
G. Beaucage, N. Agashe, H. K. Kammler, S. E. Pratsinis, J. Ilavsky, P. Jemian, T. Narayanan, D. Londono
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20 May 2016, p. 195
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D-106 In-Situ Structural Studies of Semicrystalline Polymer Blends Using Synchrotron Radiation—Invited
P. Thiyagarajan, S. Seifert, M. Kipper, B. Narasimhan
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20 May 2016, p. 195
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D-91 Looking at Small Holes: Cross-Validation of SAXS- and Betporosimetry
P. Laggner
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20 May 2016, p. 195
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D-101 From Lab to Fab: The Development and Deployment of New Metrology Technology for the Global Semiconductor Industry—Invited
B. Landes, B. Kern, J. Niu, C. Mohler, J. Hahnfeld, D. Yontz, K. Ender, C. Silvis, R. Strittmatter, L. Moore, T. Stokich, D. King, J. Quintana, S. Weigand
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20 May 2016, p. 195
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D-56 Time-Resolved Small Angle Scattering Studies of Alignment of Block Copolymer Solutions Induced by Electric Fields
V. Urban, A. Böker, H. Elbs, H. Hänsel, A. Knoll, S. Ludwigs, H. Zettl, V. Abetz, A. H. E. Müller, G. Krausch
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20 May 2016, p. 196
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F-18 A Monte Carlo Code for Simulation of Pulse Pile-Up Spectral Distortion in Pulse-Height Measurement
R. P. Gardner, W. Guo, F. Li
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20 May 2016, p. 196
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Page 2 of 7

First
« Prev
1
2
3
4
5
6
7
Next »
Last

Powder Diffraction

Refine listing

Actions for selected content:

Volume 19 - Issue 2 - June 2004

Denver X-Ray Conference

F-1 WDXRF Analysis of Thin Layers—Invited

C-5 Miniature X-ray Tubes Utilizing Carbon Nanotube-Based Cold Cathodes

F-41 New Sequential XRF: Performance Improvements Through Innovative Design

F-55 Equa All—The New Standardless Solution for Energy Dispersive X-ray Fluorescence

F-45 Diffractive Kirkpatrick-Baez Optic for Micro X-ray Fluorescence

F-46 Bench Top X-ray Fluorescence Spectrometers based on Orthogonal and Total Reflection Geometry for Excitation

D-48 Automation in Research and Production Using X-ray Powder Diffraction

D-104 Bruker AXS Super Speed Solutions for X-ray Diffraction Applications

D-90 SWAXS System-3 : The New Generation of Automated Small- and Wide-Angle X-ray Systems

D-61 Grazing-Incident X-ray Diffraction Analyses of Novel Magnetic Thin Films—Invited

D-12 Ultra-Fast Simultaneous Fitting of Several Bragg Reflections from ALAs/GaAs Superlattices Using Method of Eigenwaves

D-5 The Direct Determination of X-ray Diffraction Data from Specific Depths

D-70 “BaF2 Process”: Phase Evolution of Ba2YCu3O6+x Films

D-89 In-Situ HTXRD Characterization for Thin Films

D-108 In Situ Studies of Nano-Particle Growth in Flames—Invited

D-106 In-Situ Structural Studies of Semicrystalline Polymer Blends Using Synchrotron Radiation—Invited

D-91 Looking at Small Holes: Cross-Validation of SAXS- and Betporosimetry

D-101 From Lab to Fab: The Development and Deployment of New Metrology Technology for the Global Semiconductor Industry—Invited

D-56 Time-Resolved Small Angle Scattering Studies of Alignment of Block Copolymer Solutions Induced by Electric Fields

F-18 A Monte Carlo Code for Simulation of Pulse Pile-Up Spectral Distortion in Pulse-Height Measurement

Powder Diffraction

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Volume 19 - Issue 2 - June 2004

Denver X-Ray Conference