Denver X-Ray Conference
D-11 Measurement and Modeling of Residual Stresses at Microscopic and Mesoscopic Levels Using Micro Raman Spectroscopy and X-ray Diffraction
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- 20 May 2016, p. 198
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D-22 Simultaneous Evaluation of Total and Thermal Strains/Stresses in Thermally Cycled Thin Films
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- 20 May 2016, p. 198
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D-6 Fast In-Situ X-ray Diffraction Stress Analysis During Heat Treatment Cycles of Steel
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- 20 May 2016, p. 198
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D-52 Internal Strain Profile Around the Crack Tip and Its Influence on Hydride Formation in Zircaloy-4
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- 20 May 2016, p. 198
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D-9 Relaxation of Residual Stress in Shot Peened Ti-6Al-4V Due to Fretting Fatigue
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- 20 May 2016, p. 199
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D-53 Changes in Elastic Strain Profiles Around a Crack Tip During Tensile Loading and Unloading Cycles
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D-84 Impact of Different Strengthening Mechanisms on Intergranular Strains in Deformed Aluminum Alloys
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- 20 May 2016, p. 199
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D-57 Lattice Strain Development and Strain-Induced Phase Transformation During Fatigue of a Cobalt-Based Superalloy
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D-37 Residual Microstress Distribution in Textured Metal Materials: Method of Study and Revealed Principles
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F-58 XRF Applications in the Silica Industry—Invited
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F-57 Applications of Sample/Specimen Preparation for XRF Analysis in the Cement and Concrete Industries—Invited
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F-4 Micro WDXRF and Its Industrial Applications
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F-20 Analysis of Toxic Metals in Plastics for Compliance with Environmental Regulations
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F-14 Procedure to Consider for Fusing Copper/Iron Sulfide Concentrates
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- 20 May 2016, p. 200
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F-23 XRF Analysis of Harmful Metals Collected onto Filters as Thin Layers from Workplace Air: Inter-Laboratory Exercise
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- 20 May 2016, p. 200
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C-6 Probing the Physical and Electronic Properties of Nanomaterials—Invited
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- 20 May 2016, p. 200
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F-35 Comparison of Computed Absolute Fluorescence Photon Counts with Data from Fully Calibrated Beamlines and Detectors at PTB/BESSY-II
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- 20 May 2016, p. 200
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D-30 In-Situ High Temperature (Up to 1650°c), In air, X-ray Diffraction (Reflection Geometry) Using a Quadrupole Lamp Furnace
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- 20 May 2016, p. 200
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F-7 Element-Identified Three-Dimensional Atomic Imaging by Complex X-ray Holography
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- 20 May 2016, p. 200
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F-56 Detailed Correction Procedure for X-ray Spectroscopic Data Collected at a Synchrotron Radiation Facility: Simulations and Experiment
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- 20 May 2016, p. 200
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