Denver X-Ray Conference
D-23 In-Situ Synchrotron Waxs on Wood Foils and On Individual Wood Cells Combined with Microtensile Tests
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- 20 May 2016, p. 200
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F-31 Polycapillary Optics in Micro X-ray Fluorescence—Invited
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- 20 May 2016, p. 201
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D-75 Quantitative Analysis of Calcium Oxide Desiccant Conversion to Calcium Hydroxide Using X-ray Diffraction
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- 20 May 2016, p. 201
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D-112 Quantitative Evaluation of Graded Parabolic Multilayer Optics—Invited
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- 20 May 2016, p. 201
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C-3 Focussing for More Flux or How to Shape X-rays
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- 20 May 2016, p. 201
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D-19 High Energy Edge-Enhanced Imaging with Broadband X-rays
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- 20 May 2016, p. 201
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D-17 Recent Developments of Multilayer Optics for X-ray Diffractometry
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- 20 May 2016, p. 201
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D-13 XRD Investigations in Anhydrous and Hydrous Cementitious Systems—Invited
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- 20 May 2016, p. 201
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D-99 Characterization of Structured Fluids During Flow by Small Angle Neutron Scattering—Invited
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- 20 May 2016, p. 201
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D-100 In-Situ Structure Development During the Melt Spinning of Nylon 66—Invited
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- 20 May 2016, p. 201
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D-21 Bayesian Characterisation of Nanocrystallites from Line Profile Data
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- 20 May 2016, p. 201
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D-110 Effect of Crystal Size on Quantitative Estimation of Silica Polymorphs in Silica Bricks by X-ray Diffraction
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- 20 May 2016, p. 202
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D-58 Development of XRD in El Salvador
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- 20 May 2016, p. 202
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D-41 Two-Dimensional Mapping of Residual Stresses in 6061-T6 Aluminum Friction Stir Welds
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- 20 May 2016, p. 202
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F-27 TXRF—Versatile Applications in Depth Profiling, Speciation by XANES and Ultra Trace Element Analysis Including Low Z Elements—Invited
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- 20 May 2016, p. 202
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F-28 Trace Element Analysis Using a Benchtop TXRF-Spectrometer—Invited
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- 20 May 2016, p. 202
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F-15 Characterizing Hafnium Silicate Gate Dielectrics with a Total Reflection X-ray Fluorescence Spectrometer
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- 20 May 2016, p. 202
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F-12 PPB Analysis by XRF; A New Micro-Droplet Method for Environmental Liquid Sample
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- 20 May 2016, p. 202
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F-32 Micro X-ray Fluorescence as an Analytical Tool in Cashmere Hair Characterization
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- 20 May 2016, p. 202
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F-38 Combination of Scanning Probe Microscope and X-ray Analysis—Invited
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- 20 May 2016, p. 202
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